Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2007-02-27
2007-02-27
Hirshfeld, Andrew H. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S688000, C324S664000
Reexamination Certificate
active
11025009
ABSTRACT:
A device for measuring one or more different properties of soil or a soil-related substance is provided. The device includes a probe that is inserted into the soil or soil-related substance. The probe includes a tip. The tip is electrically insulative and defines apertures. Electrodes are fitted into the apertures. The tip and electrodes are machined together to have a desired shape that is suitable for insertion into a sample. A printed circuit board (“PCB”) is located inside the probe. The electrodes are soldered directly to the PCB in one embodiment. A temperature sensing element is also located in the tip, near the electrodes, and is connected electrically to the PCB.
REFERENCES:
patent: 3934477 (1976-01-01), Thettu
patent: 3936729 (1976-02-01), Winslow, Jr.
patent: 3965973 (1976-06-01), Thettu et al.
patent: 3968428 (1976-07-01), Numoto
patent: 3982177 (1976-09-01), Walker et al.
patent: 4020417 (1977-04-01), Brehob et al.
patent: 4160946 (1979-07-01), Frigato
patent: 4197866 (1980-04-01), Neal
patent: 4219776 (1980-08-01), Arulanandan
patent: 4408481 (1983-10-01), Sidey
patent: 4416553 (1983-11-01), Huebscher
patent: 4419023 (1983-12-01), Hager, Jr.
patent: 4441827 (1984-04-01), Coderre
patent: 4445788 (1984-05-01), Twersky et al.
patent: 4498547 (1985-02-01), Herkness, II
patent: 4575706 (1986-03-01), Heidman, Jr.
patent: 4583432 (1986-04-01), Bricker
patent: 4585996 (1986-04-01), Luce
patent: 4594899 (1986-06-01), Henke et al.
patent: 4626786 (1986-12-01), Bodecker et al.
patent: 4692695 (1987-09-01), Poduje
patent: 4791413 (1988-12-01), Lyczek
patent: 4796654 (1989-01-01), Simpson
patent: 4801865 (1989-01-01), Miller et al.
patent: 4802953 (1989-02-01), Hoeksema et al.
patent: 4806153 (1989-02-01), Sakai et al.
patent: 4841543 (1989-06-01), Dittmar et al.
patent: 4852802 (1989-08-01), Iggulden et al.
patent: 4909070 (1990-03-01), Smith
patent: 4929885 (1990-05-01), Dishman
patent: 4956535 (1990-09-01), Buelt et al.
patent: 5015988 (1991-05-01), Fletcher
patent: 5044756 (1991-09-01), Gaultney et al.
patent: 5100259 (1992-03-01), Buelt et al.
patent: 5179347 (1993-01-01), Hawkins
patent: 5186263 (1993-02-01), Kejr et al.
patent: 5209129 (1993-05-01), Jaselskis et al.
patent: 5339694 (1994-08-01), Looney et al.
patent: 5369365 (1994-11-01), Waitman
patent: 5408893 (1995-04-01), McLeroy
patent: 5411103 (1995-05-01), Werner
patent: 5428296 (1995-06-01), Champagne et al.
patent: 5435399 (1995-07-01), Peterson et al.
patent: 5445178 (1995-08-01), Feuer
patent: 5474140 (1995-12-01), Stevens
patent: 5494376 (1996-02-01), Farrar et al.
patent: 5495170 (1996-02-01), Feeney et al.
patent: 5499631 (1996-03-01), Weiland
patent: 5575260 (1996-11-01), Trost et al.
patent: 5591902 (1997-01-01), Castagner
patent: 5659251 (1997-08-01), Wakamatsu
patent: 5663649 (1997-09-01), Topp et al.
patent: 5673637 (1997-10-01), Colburn, Jr. et al.
patent: 5749521 (1998-05-01), Lattery
patent: 5777242 (1998-07-01), Zuidberg et al.
patent: 5793214 (1998-08-01), Wakamatsu
patent: 5795064 (1998-08-01), Mathis
patent: 5801537 (1998-09-01), Siddiqui et al.
patent: 5841282 (1998-11-01), Christy et al.
patent: 5847568 (1998-12-01), Stashkiw et al.
patent: 5859536 (1999-01-01), Stockton
patent: 5874672 (1999-02-01), Gerardi et al.
patent: 5879107 (1999-03-01), Kiest et al.
patent: 5887491 (1999-03-01), Monson et al.
patent: 5924369 (1999-07-01), Hatcher
patent: 5931236 (1999-08-01), Mahlum et al.
patent: 5933015 (1999-08-01), Siddiqui et al.
patent: 5936243 (1999-08-01), Gibson et al.
patent: 5945830 (1999-08-01), Magowan et al.
patent: 5975799 (1999-11-01), Carrigan et al.
patent: 5992213 (1999-11-01), Tartre
patent: 6013169 (2000-01-01), Okubo et al.
patent: 6018909 (2000-02-01), Potts
patent: 6020747 (2000-02-01), Bahns et al.
patent: 6058776 (2000-05-01), Algers et al.
patent: 6081110 (2000-06-01), Moore et al.
patent: 6110288 (2000-08-01), Penelon et al.
patent: 6138590 (2000-10-01), Colburn, Jr.
patent: 6145600 (2000-11-01), Dickinson
patent: 6182586 (2001-02-01), Hunt et al.
patent: 6208940 (2001-03-01), Kram et al.
patent: 6215317 (2001-04-01), Siddiqui et al.
patent: 6232786 (2001-05-01), Barnett
patent: 6236941 (2001-05-01), Kram et al.
patent: 6240558 (2001-06-01), Makris et al.
patent: 6265883 (2001-07-01), Clark
patent: 6289714 (2001-09-01), Tartre
patent: 6326790 (2001-12-01), Ott et al.
patent: 6352002 (2002-03-01), Weijer
patent: 6356830 (2002-03-01), Adamchuck et al.
patent: 6360829 (2002-03-01), Naber et al.
patent: 6366106 (2002-04-01), Kimori et al.
patent: 6401742 (2002-06-01), Cramer et al.
patent: 6431006 (2002-08-01), Henke et al.
patent: 6452396 (2002-09-01), Ott et al.
patent: 6452397 (2002-09-01), Ott et al.
patent: 6456079 (2002-09-01), Ott et al.
patent: 6467951 (2002-10-01), Ghoshal
patent: 6481939 (2002-11-01), Gillespie et al.
patent: 6484652 (2002-11-01), Colburn, Jr.
patent: 6494961 (2002-12-01), Simpson
patent: 6509440 (2003-01-01), Sakane et al.
patent: 6515220 (2003-02-01), Carpenter, Jr.
patent: 6529007 (2003-03-01), Ott et al.
patent: 6549852 (2003-04-01), Hanson
patent: 6559659 (2003-05-01), Cuming
patent: 6560550 (2003-05-01), Omar
patent: 6571605 (2003-06-01), Johnson
patent: 6581531 (2003-06-01), Sawers et al.
patent: 6603315 (2003-08-01), Dahms
patent: 6618673 (2003-09-01), Zur
patent: 6630947 (2003-10-01), Lieberman et al.
patent: 6647799 (2003-11-01), Raper et al.
patent: 6657443 (2003-12-01), Anderson
patent: 6683464 (2004-01-01), Park et al.
patent: 6745128 (2004-06-01), Hanson
patent: 6750450 (2004-06-01), Mukasa et al.
patent: 6766865 (2004-07-01), Dagel et al.
patent: 6767747 (2004-07-01), Bischoff et al.
patent: 6784666 (2004-08-01), Andreasen
patent: 6819120 (2004-11-01), Tam
patent: 6831470 (2004-12-01), Xie et al.
patent: 2004/0066181 (2004-04-01), Thies
Soil Solution Electrical Conductivity Measurements Using Different Dielectric Techniques, Soil Sci. Soc. Am. J. 67:1071-1078, Y. Hamed, M. Persson and R. Berndtsson (2003) (8 pages).
A Pore Water Conductivity Sensor, Soil Sci. Soc. Am. J. 64:1922-1925, M.A. Hilhorst (2000) (4 pages).
Spectrum Your Field Measurement Resource, Spectrum Technologies, inc. www.specmeters.com, Oct. 25, 2004 (19 pages).
SigmaProbe type ECl Salinity and nutrient monitoring, Soil Water and Plant Measurement, pp. 11, 12.
SigmaProbe type ECl, Sigma-P probe leaflet sowacs.com/feature/deltat/sigmaprobe.html, Dec. 13, 2004 (2 pages).
Dual-purpose Conductivity Meter for Direct Measurement in Soil and Liquids, Spectrum Technologies, Inc. (3 pages).
Bodenmessgaräte Bodenuntersuchungen Zubehör, Stelzner, Jan. 2004 (48 pages).
Spectrum Your Field Measurement Resource, Spectrum Technologies, Inc. catalogue, Spring 2004 (32 pages).
Bell Boyd & Lloyd LLC
Hirshfeld Andrew H.
Nguyen Hoai-An D.
Spectrum Technologies, Inc.
LandOfFree
Soil probe device and method of making same does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Soil probe device and method of making same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Soil probe device and method of making same will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3831181