SOI annealing method

Semiconductor device manufacturing: process – Forming bipolar transistor by formation or alteration of... – On insulating substrate or layer

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S540000, C438S913000, C438S935000

Reexamination Certificate

active

06858508

ABSTRACT:
A method for annealing an SOI in which two annealing steps are followed by a cooling step. During the second annealing step, the annealing temperature is from 993° C. to the melting point of silicon. During the cooling step, the cooling rate is not less than 0.12° C./sec when a temperature is from 993° C. to 775° C.

REFERENCES:
patent: 5371037 (1994-12-01), Yonehara
patent: 5374564 (1994-12-01), Bruel
patent: 5773355 (1998-06-01), Inoue et al.
patent: 5856229 (1999-01-01), Sakaguchi et al.
patent: 5863830 (1999-01-01), Bruel et al.
patent: 5869387 (1999-02-01), Sato et al.
patent: 5930643 (1999-07-01), Sadana et al.
patent: 6171982 (2001-01-01), Sato
patent: 6238990 (2001-05-01), Aga et al.
patent: 20020058387 (2002-05-01), Ito
patent: 20020061631 (2002-05-01), Miyabayashi et al.
patent: 0 926 707 (1999-06-01), None
patent: 0 926 713 (1999-06-01), None
patent: 58112323 (1981-11-01), None
patent: 5-217821 (1993-08-01), None
patent: 7-302889 (1995-11-01), None
patent: 2608351 (1997-05-01), None
patent: 11-145020 (1999-05-01), None
patent: 2000-91233 (2000-03-01), None
D.K. Sadana et al., “Nano-Defects in Commercial Bonded SOI and SIMOX,”Proceedings 1994 IEEE International SOI Conference, pp. 111-112 (1994).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

SOI annealing method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with SOI annealing method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and SOI annealing method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3484368

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.