Software synchronization of multiple scanning probes

Details Software synchronization of multiple scanning probes Software synchronization of multiple scanning probes

2005-09-29

2008-11-04

Cygan, Michael (Department: 2855)

Measuring and testing

Surface and cutting edge testing

Roughness

C250S306000, C250S307000

Reexamination Certificate

active

07444857

ABSTRACT:
A method and apparatus for scanning multiple scanning probe microscopes in close proximity, to scan overlapping scan areas at the same time while avoiding collision employs a control system providing drive signals to a first Atomic Force Microscope (AFM) and calculated drive signals to additional AFMs based on the first drive signals and the relative position of the additional AFMs to the first AFM for consistent spaced motion. Scanning and Failure Analysis (FA) probing of multiple feature of interest using multiple APMs allows for reduced time for locating FA features to set up measurements.

REFERENCES:
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patent: 6545492 (2003-04-01), Altmann et al.
patent: 6583411 (2003-06-01), Altmann et al.
patent: 6880389 (2005-04-01), Hare et al.
patent: 6951130 (2005-10-01), Hare et al.

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