Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-11-21
2006-11-21
Nghiem, Michael (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
Reexamination Certificate
active
07139669
ABSTRACT:
A method of software clamping a video signal for waveform display on a general purpose oscilloscope where the video signal is a.c. coupled to an input of the oscilloscope includes acquiring samples of the video signal in response to a trigger signal derived from the video signal, which samples are then stored. Then samples relative to the trigger signal that are at a nominally known voltage are retrieved, averaged and compared to a reference value. The reference value may be a value determined from a first acquisition of the video signal or a value corresponding to the nominally known voltage. The difference between the averaged samples and the reference value is then used to adjust the sample values when retrieved for display by the oscilloscope.
REFERENCES:
patent: 4203029 (1980-05-01), Kitchener et al.
patent: 6219094 (2001-04-01), Gerlach et al.
Gray Francis I.
Nghiem Michael
Rabdau Matthew D.
Tektronix Inc.
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