Measuring and testing – Inspecting
Patent
1996-01-11
1999-09-14
Williams, Hezron
Measuring and testing
Inspecting
33558, 33561, G01M 1900, G01B 300
Patent
active
059525894
ABSTRACT:
A method and device for moving a probe assembly into soft contact with a work surface includes initially placing the probe into an approach position. Advancement of the probe along a substantially perpendicular path toward the work surface is then controlled by applying a restraining force on the probe. This resisting force is decreased until the weight of the probe assembly just overcomes the static friction forces that are acting on the probe. After the static friction forces are overcome, the probe advances along a path toward the work surface. By monitoring this advancement, soft contact of the probe with the work surface can be determined when the velocity of the probe changes to zero. First, the position of the probe can be monitored to advance the probe along the path through a known travel distance. Second, the velocity of probe advancement can be monitored to indicate soft contact when velocity changes to zero. Third, accelerations of the probe can be monitored to indicate soft contact when the acceleration exceeds a predetermined threshold. Fourth, a load sensor can be placed on the probe to indicate soft contact when the load sensor generates a predetermined value. And, finally, soft contact can be accepted as being consequential of the advancement.
REFERENCES:
patent: 3743093 (1973-07-01), Klancnik
patent: 3987551 (1976-10-01), Kienle
patent: 3993565 (1976-11-01), Holthuis
patent: 4215301 (1980-07-01), Mason
patent: 4484118 (1984-11-01), Manabe et al.
patent: 4498023 (1985-02-01), Stout
patent: 4575652 (1986-03-01), Gogue
patent: 4750272 (1988-06-01), Caddell
patent: 4784539 (1988-11-01), Lehmkuhl
patent: 4809430 (1989-03-01), Maruyama et al.
patent: 4821460 (1989-04-01), Wegmann
patent: 5012591 (1991-05-01), Asakawa
patent: 5175456 (1992-12-01), Neff et al.
patent: 5310064 (1994-05-01), Neff et al.
patent: 5315189 (1994-05-01), Neff et al.
patent: 5317222 (1994-05-01), Neff et al.
patent: 5399983 (1995-03-01), Nagasawa
patent: 5414620 (1995-05-01), Kauffman
patent: 5430360 (1995-07-01), Rosenthal et al.
patent: 5446323 (1995-08-01), Neff et al.
patent: 5517190 (1996-05-01), Gunn
patent: 5691461 (1997-11-01), Goldmann et al.
Boyle Kieran
Ferris Michael A.
Johnson Christopher
Leung Arthur T.
Neff Edward A.
Soliz Chad
Systems, Machines, Automation Components Corporation
Williams Hezron
LandOfFree
Soft landing method for probe assembly does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Soft landing method for probe assembly, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Soft landing method for probe assembly will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1511811