Socket for semiconductor device

Electrical connectors – Including handle or distinct manipulating means – Randomly manipulated implement

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Details

439 72, H01R 1118

Patent

active

056559267

ABSTRACT:
A socket for use in electrically measuring and testing a semiconductor device including a body portion having a guide for holding leads of the semiconductor device, and a cover with a plurality of probes for contacting with the leads of the semiconductor device. The cover has a plurality of out-leads respectively connected to the probes to communicate electrical signals from the probes to an exterior device. The guide of the body portion is provided with a plurality of lead guide holes, and a biasing member for urging the guide toward the cover to ensure consistent contact between each of the probes and a corresponding lead.

REFERENCES:
patent: 3656183 (1972-04-01), Waltersheid
patent: 4739257 (1988-04-01), Jenson et al.
patent: 4887969 (1989-12-01), Abe
patent: 5067904 (1991-11-01), Takeuchi et al.
patent: 5154619 (1992-10-01), Matsuoka
patent: 5195903 (1993-03-01), Uratsuji
patent: 5395255 (1995-03-01), Kato
patent: 5504435 (1996-04-01), Perego

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