Socket for inspection

Details Socket for inspection Socket for inspection

2007-07-27

2011-12-13

Hollington, Jermele M (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

08076952

ABSTRACT:
A support block is provided with a plurality of through holes for supporting probes. The probes for signals, for power supply and for grounding are secured in the through holes of the support block and electrically interconnect electrode terminals of a device to be inspected, which is provided on one face side of the support block, and wiring terminals connected to an inspection unit, which is provided on the other face side of the support block. A device guide is integrally formed with or separately fixed to the one face side of the support block, and includes an opening having a square shape in a plan view for guiding the device to be inspected. A centering mechanism adjusts a position of the device to be inspected at a center position of the opening of the device guide.

REFERENCES:
patent: 6535002 (2003-03-01), Haseyama et al.
patent: 6958616 (2005-10-01), Mahoney et al.
patent: 2004/0095157 (2004-05-01), Sato et al.
patent: 5-20286 (1993-03-01), None
patent: 2004-14470 (2004-01-01), None
patent: 2004-014470 (2004-01-01), None
patent: 2004-170182 (2004-06-01), None
Office Action issued by the Japanese Patent Office dated Apr. 22, 2011 in a counterpart foreign application.

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