Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2011-01-11
2011-01-11
Nguyen, Ha Tran T (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S755090, C324S760020
Reexamination Certificate
active
07868642
ABSTRACT:
A simple structure socket10for connecting a ball grid array integrated circuit device to a test circuit has a base14, contacts26arranged corresponding to the ball grid array, a nest assembly16of two comb structures70and a lever assembly18for spacing opposed tip portions of each contact away from each other to define a gap for receiving a ball. The lever assembly has two rectangular frames86each made of a distal cross piece94, a proximal cross piece and two side pieces connecting the distal and proximal cross pieces. The two rectangular frames are arranged so that the side pieces are intersected at substantially mid portions thereof. This allows that, by depressing the proximal cross pieces toward the base, the distal cross pieces forces the comb structures toward each other.
REFERENCES:
patent: 5256080 (1993-10-01), Bright
patent: 5493237 (1996-02-01), Volz et al.
patent: 5498970 (1996-03-01), Petersen
patent: 5611705 (1997-03-01), Pfaff
patent: 5807127 (1998-09-01), Ohshima
patent: 5865639 (1999-02-01), Fuchigami et al.
patent: 5923179 (1999-07-01), Taylor
patent: 6046597 (2000-04-01), Barabi
patent: 6160709 (2000-12-01), Li
patent: 6208155 (2001-03-01), Barabi et al.
patent: 6262581 (2001-07-01), Han
patent: 6280219 (2001-08-01), Sano et al.
patent: 6638091 (2003-10-01), Yamagishi
patent: 6666691 (2003-12-01), Ikeya
patent: 6743034 (2004-06-01), Shimada
patent: 6749443 (2004-06-01), Sano et al.
patent: 6752645 (2004-06-01), Nakamura et al.
patent: 6824411 (2004-11-01), Ohshima
patent: 6827599 (2004-12-01), Gattuso et al.
patent: 6875025 (2005-04-01), Hsu et al.
patent: 6899558 (2005-05-01), Okamoto
patent: 6969266 (2005-11-01), Chu et al.
patent: 6998862 (2006-02-01), Cram
patent: 7189092 (2007-03-01), Piatti
patent: 7214084 (2007-05-01), Hayakawa
patent: 7230830 (2007-06-01), Ujike et al.
patent: 7278868 (2007-10-01), Sato et al.
patent: 7548422 (2009-06-01), Hsieh
patent: 0 400 967 (1990-12-01), None
patent: 0 574 157 (1993-12-01), None
patent: 60186021 (1985-09-01), None
patent: 1114057 (1989-05-01), None
patent: WO 97/03467 (1997-01-01), None
patent: WO 01/61364 (2001-08-01), None
Nagumo Takayuki
Naito Masahito
3M Innovative Properties Company
Benitez Joshua
Kusters Johannes P. M.
Nguyen Ha Tran T
LandOfFree
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