Socket and test apparatus

Details Socket and test apparatus Socket and test apparatus

2007-04-10

2007-04-10

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

11337895

ABSTRACT:
A socket electrically coupled to a BGA unit includes a plurality of ball contacts including a housing wherein a through-hole having a larger diameter than that of the ball contact is formed in a surface of the housing, which faces the BGA unit, in order to the through-hole corresponds the plurality of ball contacts and a pin contact provided in a plurality of through-holes and contacting a corresponding side part of the ball contact. More desirably, the plurality of pin contacts is provided in order that each extending directions of the pin contacts are opposite to one another.

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Partial English translation of Korean Office Action issued Apr. 28, 2006 in corresponding Korean patent application (1 page).
International Search Report issued for International application No. PCT/JP2004/009935 and English translation thereof, 4 pages.

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