Socket

Details Socket Socket

2005-02-01

2005-02-01

Le, Thanh-Tam (Department: 2839)

Electrical connectors

With coupling movement-actuating means or retaining means in...

For dual inline package

C439S330000

Reexamination Certificate

active

06848928

ABSTRACT:
A test socket10of the present invention includes a base member20, a cover member30which is installed on base20to move in reciprocal straight line movement between a first position away from the base and a second position adjacent the base and a plurality of contact members40that are fixed in the base and are capable of making contact with terminals2on a semiconductor device1when such device1is mounted on base20. A latch member60is supported on base20in a rotatable manner to move in linkage with the movement of cover member30. A compression member80is pivotably attached to a tip portion62of latch member60for pressing semiconductor part1onto base20to achieve reliable contacting between terminals2and contacts40in response to movement of cover member30. This socket design will provide for wide area engagement between the surface of semiconductor part1and compression member80to prevent damage to the semiconductor part1during testing.

REFERENCES:
patent: 5320550 (1994-06-01), Uratsuji et al.
patent: 5865639 (1999-02-01), Fuchigami et al.
patent: 6280219 (2001-08-01), Sano et al.
patent: 6322384 (2001-11-01), Ikeya
patent: 6666691 (2003-12-01), Ikeya

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