Smart spacecraft structures based on laser metrology

Optics: measuring and testing – Shape or surface configuration

Reexamination Certificate

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C356S614000, C356S237100

Reexamination Certificate

active

10917924

ABSTRACT:
A laser metrology system for estimating the deformation of a structure is provided. The system includes a plurality of laser beam position detectors distributed across a surface of the structure. Each laser beam position detector is intersected by a laser beam and is configured to determine the change in location of the intersection point in at least one dimension. By determining the change in location of the intersection point for each laser beam position detector, the laser metrology system can calculate the deformation of the structure that caused these changes in location.

REFERENCES:
patent: 4591996 (1986-05-01), Vachon
patent: 5517861 (1996-05-01), Haas et al.
patent: 6081614 (2000-06-01), Yamada et al.
patent: 2005/0082262 (2005-04-01), Rueb et al.

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