Smart probe

Details Smart probe Smart probe

2007-08-31

2010-06-15

Smith, R. Alexander (Department: 2841)

Geometrical instruments

Gauge

Movable contact probe, per se

C033S502000, C033S503000

Reexamination Certificate

active

07735234

ABSTRACT:
The present system, method, article of manufacture, software, and apparatus is an “intelligent” probe system and components thereof and may openly encompass, in at least an embodiment, an embedded IC chip located in an interchangeable probe(s) which offers repeatable, fast, easy, and error free probe swapping on a CMM.

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International Search Report with Written Opinion, Application No. PCT/US2007/019279, Date Mailed Apr. 29, 2008.

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