Smart debug interface circuit for efficiently for debugging a so

Details Smart debug interface circuit for efficiently for debugging a so Smart debug interface circuit for efficiently for debugging a so

1997-02-28

1999-06-22

Kim, Kenneth S.

Excavating

371 221, 371 2232, 3951831, G06F 1125

Patent

active

059150831

ABSTRACT:
The present invention comprises a smart debug interface circuit for the diagnostic testing and debugging of a software application for a programmable digital processor system. The smart debug interface circuit of the present invention includes an instruction register for coupling to an instruction bus of a programmable digital processor. The instruction register is adapted to drive instructions onto the instruction bus. The instruction register couples to the instruction bus in a parallel manner. The smart debug interface circuit of the present invention includes a data register for coupling to a data bus of the programmable digital processor. The data register is adapted to read data from the data bus and couples to the data bus in a parallel manner. The instruction register and data register are each coupled to an interface port. The interface port couples the smart debug interface circuit to a host computer system. A control logic circuit is also included in the smart debug interface circuit of the present invention. The control logic circuit is coupled to the instruction register, the data register, and the interface port. The control logic circuit interfaces a debugging program on the host computer system to the programmable digital processor. Additionally, the control logic circuit interfaces the debugging program with the programmable digital processor without imposing boundary scan bus delay on the instruction bus or the data bus.

REFERENCES:
patent: 4924382 (1990-05-01), Shouda
patent: 5053949 (1991-10-01), Allison et al.
patent: 5479652 (1995-12-01), Dreyer et al.
patent: 5488728 (1996-01-01), Dreyer
patent: 5530804 (1996-06-01), Edgington et al.
patent: 5544311 (1996-08-01), Harenberg et al.

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