Registers – Records – Conductive
Reexamination Certificate
2007-05-08
2007-05-08
Lee, Seung Ho (Department: 2876)
Registers
Records
Conductive
C235S451000, C235S493000
Reexamination Certificate
active
11121689
ABSTRACT:
A smart card having a support element, at least one electrically conductive contact-making element in a surface area of the support element, and at least one electrical circuit, which is on and/or in the support element, and is coupled to the at least one electrically conductive contact-making element. Microstructures and/or nanostructures are incorporated in the at least one electrically conductive contact-making element, of such a size that the microstructures and/or nanostructures absorb electromagnetic radiation at at least one wavelength.
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Coyle, S et al.; “Confined Plasmons in Metallic Nanocavities”; Physical Review Letters; vol. 87, No. 17; Oct. 22, 2001: 176801-1 to 176801-4.
Dickstein , Shapiro, LLP.
Ho Lee Seung
Infineon - Technologies AG
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