Smart B-I-T (Built-In-Test)

Details Smart B-I-T (Built-In-Test) Smart B-I-T (Built-In-Test)

1997-04-07

1999-08-10

Shah, Kamini

Data processing: measuring, calibrating, or testing

Testing system

371 204, 371 225, 371 671, 714 51, 714 48, G06F 1100, G01R 3128

Patent

active

059373660

ABSTRACT:
A smart built-in-test device for classifying fault behavior in electronic systems comprising a temporal monitor monitoring fault, classifying fault behavior and generating fault behavior data as the system operates in real time; one or more sensors for measuring environmental stress conditions in real-time and outputting environmental stress condition data. A fault correlator device for receiving the fault behavior data and the environmental stress condition data and correlating fault behavior to environmental stress conditions to determine if significant correlation exists.

REFERENCES:
patent: 4727549 (1988-02-01), Tulpule et al.
patent: 5652754 (1997-07-01), Pizzica

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