Slurry composition and method for chemical mechanical...

Cleaning compositions for solid surfaces – auxiliary compositions – Cleaning compositions or processes of preparing – For cleaning a specific substrate or removing a specific...

Reexamination Certificate

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C252S079100, C438S692000

Reexamination Certificate

active

08080505

ABSTRACT:
The present invention is related to a slurry composition for polishing copper integrated with tungsten containing barrier layers and its use in a CMP method. The present invention is also related to a method for polishing copper integrated with tungsten containing barrier layers by means of an aqueous solution containing abrasive particles, an inorganic acid such as HNO3as etchant for copper that prevents galvanic corrosion of the tungsten containing metal barrier and at least one organic compound to provide sufficient copper corrosion inhibition.

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Ernur, D.Corrosion of Copper Interconnects, Jan. 2005, K.U. Leuven, Leuven, XP001206904, Chapter 5.

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