Optics: measuring and testing – By dispersed light spectroscopy – With monochromator structure
Patent
1983-10-14
1986-03-11
Evans, F. L.
Optics: measuring and testing
By dispersed light spectroscopy
With monochromator structure
356334, 350271, G01J 304, G01J 318
Patent
active
045752427
ABSTRACT:
A slit mechanism for use in a monochromator which is capable of changing not only the slit width but also the slit height. The slit mechanism is provided with a plurality of pairs of slits formed in a disk rotatable about an axis. The two slits in each pair have the same width and the same height, and each pair of slits have a different width from those of the other pairs of slits. The slit mechanism is further provided with at least one additional pair of slits having the same width as the width of, and a different height from the height of, a predetermined pair of the plurality of pairs of slits. All the pairs of slits are arranged circumferentially of a circle on the disk concentric with the axis of rotation of the disk, so that each pair of slits are positioned diametrically opposite to each other on the circle so as to serve as an entrance and an exit slit, respectively, for the monochromator. The slits may also be arranged on a disk circumferentially of two circles of different diameters concentric with each other and the axis of rotation of the disk, so that one slit in each pair is on one of the two circles while the other slit in the pair is on the other circle diametrically opposite to the one slit.
REFERENCES:
patent: 3508813 (1970-04-01), Smith, Jr. et al.
patent: 3708227 (1973-01-01), Krakow et al.
Brochure-New McPherson High Performance Scanning Monochromator, Model 2051.
Akiyama Osamu
Hira Rikuo
Evans F. L.
Shimadzu Corporation
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