Slit lamp microscope and selectively insertable diaphragm disk

Details Slit lamp microscope and selectively insertable diaphragm disk Slit lamp microscope and selectively insertable diaphragm disk

1993-02-23

1994-06-14

Sikes, William L.

Optics: eye examining, vision testing and correcting

Eye examining or testing instrument

Objective type

351215, 359235, 359377, A61B 310, G02B 2122

Patent

active

053214463

ABSTRACT:
In a slit lamp microscope, changeover can be selectively made between conventional slit lamp microscopy and confocal perforated disk microscopy. In slit lamp operation, the microscope is constructed as a stereo microscope. The Nipkow perforated disk required for the confocal perforated disk microscopy is arranged in an indirect beam path. Alternatively, the Nipkow disk can be arranged on a pivotable support element and can be pivoted into the beam path in the vicinity of an intermediate image plane. For confocal perforated disk microscopy, an additional illumination device is provided that is reflected into the beam path between the Nipkow disk and the oculars. The insertion of the Nipkow disk or the switching of the beam paths takes place such that the focal plane of the objective is constant. A changeover is made from conventional slit lamp microscopy to confocal perforated disk microscopy without refocusing. A direct comparison of the images observed with the two procedures is therefore possible.

REFERENCES:
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patent: 4884880 (1989-12-01), Lichtman et al.
patent: 4900145 (1990-02-01), Akiyama
patent: 4927254 (1990-05-01), Kino et al.
patent: 5020891 (1991-06-01), Lichtman et al.
patent: 5099354 (1992-03-01), Lichtman et al.
Kino, Gordon S. and Corle, Timothy R., "Confocal Scanning Optical Microscopy" Physics Today, Sep. 1989 pp. 55-62.
Muller, Ortwin Ocular Examination with the Slit Lamp, Zeiss, West Germany K-30-115e, MA-H-111/83 Koo (no date).

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