Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Objective type
Reexamination Certificate
2005-01-19
2008-08-12
Schwartz, Jordan M. (Department: 2873)
Optics: eye examining, vision testing and correcting
Eye examining or testing instrument
Objective type
C251S221000
Reexamination Certificate
active
07410257
ABSTRACT:
Disclosed is a slit lamp microscope capable of forming a slit superior in terms of parallelism. The slit lamp microscope includes casings (100L and100R) to the bottoms surfaces of which slit blades (107L) and (107R) are fixed and which are connected together so as to be rotatable around shaft members (102), and an inter-casing distance varying member (87) adapted to change the distance between the casings (100L and100R) in correspondence with vertical movement of an ascent/descent shaft (86). Coil-like portions of torsion springs (103) are wound around the shaft members (102) to which the casings (100L and100R) are connected. The torsion springs (103) urge the casings (100L and100R) so as to bring the slit blades (107L and107R) close to each other. Further, the casings (100L and100R) are equipped with U-shaped springs (106) urging protrusions (100L′ and100R′) thereof so as to press them against the shaft members (102).
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Patent Abstracts of Japan vol. 2003, No. 12, Dec. 5, 2003 & JP 2003-299619 A (Topcon Corp), Oct. 21, 2003.
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Edwards Angell Palmer & & Dodge LLP
Jones James C
Kabushiki Kaisha Topcon
Schwartz Jordan M.
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