Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Objective type
Patent
1992-04-28
1995-06-13
Shafer, Ricky D.
Optics: eye examining, vision testing and correcting
Eye examining or testing instrument
Objective type
351214, 354 62, A61B 310
Patent
active
054247888
ABSTRACT:
A slit lamp microscope is of the type having an illumination optical system for illuminating the eye to be examined, an observation optical system for observing the illuminated eye to be examined and a photographing unit. The slit lamp microscope comprises exposure control unit for controlling exposure at the time of photographing, a photographing conditions designation arrangement for designating at the time of photographing at least the designation of a part to the eye to be photographed and conditions regarding system of photographing, and an optimal exposure calculation unit for calculating an optimal exposure in accordance with the designated photographing conditions. The exposure control apparatus controls the exposure in accordance with the value of exposure calculated by the optimal exposure calculation unit when the photographing conditions are designated by the photographing conditions designation means.
REFERENCES:
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patent: 4773749 (1988-09-01), Ohtomo et al.
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patent: 4807989 (1989-02-01), Nagano et al.
patent: 4834526 (1989-05-01), Nunokawa
patent: 5118179 (1992-06-01), Sano et al.
Oda Haruo
Satake Eiji
Tomioka Ken
Nikon Corporation
Shafer Ricky D.
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