Slit diaphragm system defining X-ray examination zone with visib

Details Slit diaphragm system defining X-ray examination zone with visib Slit diaphragm system defining X-ray examination zone with visib

1990-08-13

1992-08-04

Howell, Janice A.

X-ray or gamma ray systems or devices

Accessory

Alignment

378 62, 378146, 378147, 378152, A61B 608

Patent

active

051366274

ABSTRACT:
At least one primary diaphragm comprises two elements displaceable so as to form a linear fan-shaped beam which is incident on an object to be examined. The elements form the slit-shaped aperture forming the fan beam in their normal X-ray beam forming position and are moveable to a respective, selectable limit position perpendicularly to the fan shaped beam in order to define and mark an examination zone greater in cross-section area than the fan beam with a light beam. Light incident on the examination zone is restricted by the diaphragm elements in their limit positions, thus marking the examination zone with the light beam. X-ray exposure of the object to be examined takes place only when the elements are between the two positions defining the examination zone of the primary diaphragm where its diaphragm elements occupy in their respective limit positions.

REFERENCES:
patent: 3629594 (1971-12-01), Sandberg
patent: 3921001 (1975-11-01), Edholm et al.
patent: 4060733 (1977-11-01), Franke et al.
patent: 4167675 (1979-09-01), Stodberg et al.
patent: 4419764 (1983-12-01), Kinanen
patent: 4521905 (1985-06-01), Hosokawa
patent: 4670896 (1987-06-01), Klausz
patent: 4672212 (1987-06-01), Brahme
patent: 4715056 (1987-12-01), Vlasbloem et al.
patent: 4894850 (1990-01-01), Frings et al.
patent: 4969174 (1990-11-01), Scheid et al.

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