Skew measurement apparatus, skew measurement method,...

Details Skew measurement apparatus, skew measurement method,... Skew measurement apparatus, skew measurement method,...

2011-04-26

2011-04-26

Le, John H (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C324S765010, C702S069000

Reexamination Certificate

active

07933728

ABSTRACT:
Provided is a skew measurement apparatus, including sampling sections that each sample one of a plurality of signals under measurement having a cycle T, a waveform reconfiguring section that shapes a reconfigured waveform having the cycle T by rearranging ordinal ranks of sample values of the signal under measurement sampled by each sampling section, a distribution generating section that generates a timing distribution of edges in the reconfigured waveform of the corresponding signal under measurement, and a skew calculating section that calculates skew between the signals under measurement being compared based on the timing distribution of each signal under measurement.

REFERENCES:
patent: 7127018 (2006-10-01), Yamaguchi et al.
patent: 7394277 (2008-07-01), Ishida et al.
patent: 2009/0281751 (2009-11-01), Ishida et al.
“Jitter Analysis Clock Solutions,” WAVECREST Corporation.1998.

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