Data processing: measuring – calibrating – or testing – Testing system
Reexamination Certificate
2007-08-07
2007-08-07
Wachsman, Hal (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
C702S109000, C702S110000, C702S111000, C702S112000, C702S113000, C702S114000, C702S115000, C702S116000, C702S117000, C702S118000, C702S119000, C702S120000, C702S121000, C702S122000, C702S123000
Reexamination Certificate
active
11231722
ABSTRACT:
A method for use with a test system having sites that hold devices under test (DUTs) includes executing a first site loop to iterate through the sites, where the first site loop includes an instruction to program hardware associated with at least one of the sites, and executing a second site loop to process data received from the DUTs, where the second site loop and the first site loop have a same syntax.
REFERENCES:
patent: 5845234 (1998-12-01), Testa et al.
patent: 6941232 (2005-09-01), Burke et al.
patent: 2004/0225465 (2004-11-01), Pramanick et al.
patent: 2005/0154551 (2005-07-01), Pramanick et al.
patent: 2005/0261856 (2005-11-01), Kushnick et al.
International Search Report for Application No. PCT/US06/13546, dated Apr. 12, 2006.
Written Opinion for Application No. PCT/US06/13546, dated Apr. 12, 2006.
Fish & Richardson P.C.
Huynh Phuong
Teradyne, Inc.
Wachsman Hal
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