Singulated bare die tester and method of performing forced tempe

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

324754, 439 67, G01R 3100

Patent

active

054753171

ABSTRACT:
A reusable test socket is described for testing singulated bare die to determine, before packaging, that the bare die is a "known good die". The socket contains a circuit pad pattern in the mirror image of the bond pad pattern of the bare die to be tested. Each pad of the socket contains a conductive elastomeric probe which has been "screened" onto the bond pad. The socket also contains an alignment template for orienting the bare die onto the elastomeric probes of the pad pattern of the test socket. Additionally, the socket can be a singular piece or it can be made of two main pieces; the first being a socket, and the second being a test board designed to mate with the socket. Further, the socket can be utilized in conjunction with a clamp for holding the bare die in place and with a thermoelectric cooler. The thermoelectric cooler is used to heat or cool the die at all temperatures required for military certification and other extended temperature applications. The disclosed invention also includes a method of using the reusable test socket which includes the steps of placing the bare die onto the test socket, placing the socket into electrical continuity with test equipment, conducting tests at ambient temperatures, subjecting the die to a prolonged period of "burn-in" at elevated temperatures, conducting further electrical tests at various temperatures, and determining whether the bare semiconductor die is a "known good die".

REFERENCES:
patent: 4329642 (1982-05-01), Luthi
patent: 5006792 (1991-04-01), Malhi
patent: 5006796 (1991-04-01), Burton
patent: 5123850 (1992-06-01), Elder
patent: 5302891 (1994-04-01), Wood

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Singulated bare die tester and method of performing forced tempe does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Singulated bare die tester and method of performing forced tempe, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Singulated bare die tester and method of performing forced tempe will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1362455

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.