Optics: measuring and testing – Material strain analysis – By light interference detector
Patent
1995-02-09
1996-09-10
Turner, Samuel A.
Optics: measuring and testing
Material strain analysis
By light interference detector
356345, 356358, G01B 902
Patent
active
055554709
ABSTRACT:
A Michelson interferometer is used to determine the displacement of a force loaded member, the loaded member having a reflective surface applied thereto to reflect light back to a beam splitter in the interferometer apparatus. Light is also reflected back from a reflective surface attached to a stationary member. The interaction of the reflected light from the movable and stationary member interacts to form an interference fringe pattern which may be used to determine the amount of displacement and, therefor, the force applied to the loaded member. The apparatus is comprised of a material which is substantially resistive to thermal deformation.
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Cole Neil M.
Dennis Robert G.
The Regents of the University of Michigan
Turner Samuel A.
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