Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-11-29
2005-11-29
Tang, Minh N. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S1540PB
Reexamination Certificate
active
06970009
ABSTRACT:
A signal translator circuit, for use in sending test signals to an IC-chip in a chip testing system, includes first and second resistors, and a single transistor. The transistor has a current channel which is coupled in series with the first resistor between a source voltage terminal and an output terminal. The single transistor also has a control lead, for enabling and disabling the flow of current through the current channel, which receives an input test signal at voltage levels that are to be translated. The output terminal is coupled through the second resistor to a reference voltage terminal. The output terminal is also coupled to an input terminal of a socket which is structured to hold the IC-chip.
REFERENCES:
patent: 6147549 (2000-11-01), Ohno
patent: 6373260 (2002-04-01), Weller et al.
Carlson Robert Howard
Ostrowski Carl Larry
Fassbender Charles J.
Rode Lise A.
Starr Mark T.
Tang Minh N.
Unisys Corporation
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