Single sweep measurement of multiple optical characteristics

Details Single sweep measurement of multiple optical characteristics Single sweep measurement of multiple optical characteristics

2005-05-03

2005-05-03

Nguyen, Tu T. (Department: 2877)

Optics: measuring and testing

For optical fiber or waveguide inspection

Reexamination Certificate

active

06888625

ABSTRACT:
A method of measuring multiple optical characteristics of an optical device during a single sweep of a swept wavelength optical system cyclically changes an input state of polarization on consecutive optical frequency increments of an optical signal within the wavelength range of the swept wavelength optical system. From the measured output states of polarization a wavelength-dependent Jones matrix is calculated, and from the Jones matrix the multiple optical characteristics are determined, which characteristics may include PDL and DGD.

REFERENCES:
patent: 5298972 (1994-03-01), Heffner
patent: 5724126 (1998-03-01), Nishi et al.
patent: 6504604 (2003-01-01), Holland
patent: 20020196426 (2002-12-01), Sloite
Publication: Dennis Derickson, “Fiber Optic Test and Measurement”, 1998, pp. 224-226, published by Prentice Hall, Inc., Upper Saddle River, New Jersey.
Derickson, Dennis, “Fiber Optic Test and Measurement,” 1998, pp. 224-226, XP002293688, Hewlett-Packard Company, Prince Hall, New Jersey.

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