Dynamic magnetic information storage or retrieval – Monitoring or testing the progress of recording
Reexamination Certificate
2008-11-17
2010-10-19
Olson, Jason C (Department: 2627)
Dynamic magnetic information storage or retrieval
Monitoring or testing the progress of recording
C360S025000
Reexamination Certificate
active
07817363
ABSTRACT:
In one embodiment, defects are detected on the face of a hard-disk drive platter. A preamble, a sync mark, user or pseudorandom data, and a data pad are written to every sector on a track of the platter. Inter-sector gaps that separate consecutive sectors are overwritten with a fixed data pattern such that consecutive sectors are in phase lock with one another. After the track has been written, the track is read back and analyzed. Consecutive sectors are analyzed continuously without stopping. The preambles, sync marks, data pads, and overwritten inter-sector gaps are analyzed using suitable flaw-scan techniques. The user or pseudorandom data is analyzed using both data-integrity checks and suitable flaw-scan techniques. This process is repeated for all tracks on the disk, and defect detection is completed when all tracks have been analyzed.
REFERENCES:
patent: 4656532 (1987-04-01), Greenberg et al.
patent: 5031054 (1991-07-01), Lewis
patent: 5844920 (1998-12-01), Zook et al.
patent: 6353315 (2002-03-01), Egan et al.
patent: 2004/0047258 (2004-03-01), Pan et al.
patent: 2009/0034109 (2009-02-01), Paul et al.
O'Brien Keenan T.
Rauschmayer Richard
Agere Systems Inc.
Brown Craig M.
Mendelsohn Steve
Mendelsohn, Drucker & Associates P.C.
Olson Jason C
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