Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Patent
2000-03-27
2000-12-26
Powell, William
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
438721, 438723, 438738, H01L 2100
Patent
active
061659088
ABSTRACT:
In a charge coupled device, a plurality of charge transfer electrodes are formed on a first insulating layer formed on a semiconductor substrate. Each of the charge transfer electrodes is formed by a first conductive layer and a second conductive layer narrower than the first conductive layer. A second insulating layer having the same area as the second conductive layer and is formed on the second conductive layer. A sidewall insulating layer is formed on sidewalls of the second insulating layer and the second conductive layer.
REFERENCES:
patent: 5296653 (1994-03-01), Kiyota et al.
patent: 5428231 (1995-06-01), Tanaka et al.
Kwok K. Ng, "Chapter 15--Charge-Coupled Device", Complete Guide to Semiconductor Devices, pp. 132-142.
N. Tanaka et al., "Study of single-layer metal-electrode CCD image sensor", Proceedings of the Institute of Television Engineers of Japan, vol. 50, No. 2, 1996, pp. 234-240.
Hatano Keisuke
Nakashiba Yasutaka
NEC Corporation
Powell William
LandOfFree
Single-layer-electrode type charge coupled device having double does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Single-layer-electrode type charge coupled device having double , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Single-layer-electrode type charge coupled device having double will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-994467