Patent
1989-07-28
1990-11-06
Tarcza, Thomas H.
350 383, G03H 110
Patent
active
H00008419
ABSTRACT:
A system in which the light of a single laser is used to both expose a hologram and to simultaneously measure the formation of the hologram in the recording material.
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Yoshiaki Nakano and Kunio Tada, In Situ Monitoring Technique for Fabrication of High-Quality Diffraction Gratings, Optics Letters Jan. 1988/vol. 13 No. 1, pp. 7-9.
Bush Fred M.
Deaton James T.
Tarcza Thomas H.
The United States of America as represented by the Secretary of
Wallace Linda J.
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