Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1990-06-25
1993-06-08
Harvey, Jack B.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324667, 324649, G01R 2726
Patent
active
052183092
ABSTRACT:
A method for the nondestructive measurement of the moisture content of single grain kernels, seeds, nuts, or fruits which is independent of their weight, thickness, and projected area. At least two independent parameters of complex electrical impedance or admittance of a single grain kernel, seed, nut, or fruit are measured at two different frequencies and the moisture content is calculated therefrom.
REFERENCES:
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patent: 3323049 (1967-05-01), Hanken
patent: 3348140 (1967-10-01), Godding
patent: 4584522 (1986-04-01), Varela
patent: 4922181 (1990-05-01), Pullan
patent: 5039947 (1991-08-01), Kraszewski
C. V. K. Kandala et al., "Measurement of Moisture Content in Single Kernels of Peanuts: A Nondestructive Electrical Method," Paper No. 89-6103 presented at ASAE/CSAE Meeting, Quebec, PQ, Canada, Jun. 25-28, 1989, 11 pp.
C. V. K. Kandala et al., "Moisture Determination in Single Kernels of Corn--A Nondestructive Method," Trans. ASAE 31(6): 1890-1895 (Nov.-Dec. 1988).
S. O. Nelson, "Dielectric Properties of Grain and Seed in the 1 to 50-MC Range," Trans. ASAE 8(1): 38-48 (1965), Dec.
Kandala Venkatrkrishna S.
Lawrence Kurt C.
Leffler Richard G.
Nelson Stuart O.
Deck Randall E.
Fado John D.
Harvey Jack B.
Silverstein M. Howard
The United States of America as represented by the Secretary of
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