Optics: measuring and testing – By light interference
Reexamination Certificate
2006-05-23
2006-05-23
Toatley, Gregory J. (Department: 2877)
Optics: measuring and testing
By light interference
C356S498000, C359S834000
Reexamination Certificate
active
07050171
ABSTRACT:
A interferometer that has no moving parts and can acquire an interferogram in a single exposure is disclosed. Embodiments according to the invention can be used for polychromatic and/or monochromatic detection and include a fixed-position element that divides a beam segment into a plurality of parallel sub-beams of successively increasing path lengths. Embodiments according to the invention can be constructed from separate elements or can be combined into a one-piece device to provide increased stability and ruggedness.
REFERENCES:
patent: 3127465 (1964-03-01), Stephens
patent: 4309109 (1982-01-01), Blodgett et al.
Banerjee Ajit
Jensen James O.
Loerop William R.
Merrow Clifton N.
Biffoni Ulysses John
Detschel Marissa J
The United States of America as represneted by the Secretary of
Toatley Gregory J.
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