Single crystal growth method and single crystal pulling...

Single-crystal – oriented-crystal – and epitaxy growth processes; – Processes of growth from liquid or supercritical state – Having pulling during growth

Reexamination Certificate

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C117S030000, C117S217000, C117S218000

Reexamination Certificate

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08083852

ABSTRACT:
A silicon single crystal growth method of pulling up and growing a single crystal from a melt of a silicon raw material melted in a quartz crucible based on a Czochralski method, the method comprising the steps of: applying a direct current voltage in such a manner that an outer wall of the quartz crucible acts as a positive electrode and an electrode immersed into the melt of the silicon raw material acts as a negative electrode, the immersed electrode being placed separately from a pulling member for pulling the single crystal; and growing the single crystal with the pulling member while passing an electric current through the electrode, and a pulling apparatus thereof.

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patent: WO 2008/120435 (2008-10-01), None
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Watanabe et al., “Controlling oxygen concentration and distribution in 200 mm diameter Si crystals using the electromagnetic Czochralski (EMCZ) method,”Journal of Crystal Growth, vol. 237, pp. 1657-1662, Apr. 2002.
Liu et al., “Investigation of oxygen distribution in electromagnetic CZSi melts with a transverse magnetic filed using 3D global modeling,”Journal of Crystal Growth, vol. 299, pp. 48-58, Feb. 1, 2007.
International Search Report issued in Application No. PCT/JP2009/001282; Dated Jun. 30, 2009 (With Translation).

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