Single beam photometer for investigating a specimen

Details Single beam photometer for investigating a specimen Single beam photometer for investigating a specimen

1976-06-22

1978-05-23

Evans, F. L.

Optics: measuring and testing

Refraction testing

Prism engaging specimen

356189, 356201, G01J 350, G01N 2124

Patent

active

040907929

ABSTRACT:
In a single beam photometer the transmitted radiation is modulated in respect of wavelength. As the modulator, an interference pattern filter is used, whose transmitted wavelength agrees in the middle approximately with the absorption band to be measured. The interference pattern filter is either arranged so as to be rotatable in the beam path or oscillates at right angles to the optical axis. The electronic system is tuned to the first harmonic of the interference pattern filter frequency; i.e. the effects of signals of other frequencies are suppressed by the electronics.

REFERENCES:
patent: 3744918 (1973-07-01), Jacobsson
patent: 3994592 (1976-11-01), Lardon et al.

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