Single beam angular deviation measurement system and method

Details Single beam angular deviation measurement system and method Single beam angular deviation measurement system and method

1991-07-05

1993-02-16

Evans, F. L.

Optics: measuring and testing

Inspection of flaws or impurities

Transparent or translucent material

G01N 2100

Patent

active

051875411

ABSTRACT:
System and method for measuring angular deviation in a transparency are described which comprise the steps of directing a large diameter collimated beam of light along an optical axis through a transparency, focusing a portion of the collimated beam, determining the position of the focus of the beam portion relative to the axis, repeating the above steps without the transparency, measuring any difference in position of the focus with and without the transparency, and calculating the vertical and horizontal components of angular deviation in the transparency according to relationships disclosed.

REFERENCES:
patent: 3688235 (1972-08-01), Migeotte
patent: 3693015 (1972-09-01), Funk, Jr.
patent: 4249823 (1981-02-01), Task
patent: 4377341 (1983-03-01), Task et al.
patent: 4398822 (1983-08-01), Task

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