Single beam AC interferometer

Details Single beam AC interferometer Single beam AC interferometer

1989-03-09

1990-11-06

Willis, Davis L.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356432, G01B 902

Patent

active

049681443

ABSTRACT:
A single beam interferometer (10) comprises an intensity modulated laser beam (16) having a focus area for heating a test area (18) on the surface of a sample (12) producing a thermal bump (20). An unfocused probe laser beam (30) is directed toward the solid at an angle and has a beam area greater than the focus area of the heating beam (16). The sample (12) has a reflective surface for reflecting the probe beam (30). The reflected beam (31) comprises an AC beam portion (32) refracted by the thermal bump (20) and a DC beam portion (34) reflected off the unheated surface of the sample (12). The interference pattern (36) produced by the reflected beam (31) is detected and processed to obtain optical, elastic and thermal parameters of the sample (12).

REFERENCES:
patent: 4522510 (1985-06-01), Rosencwaig et al.
patent: 4581939 (1986-04-01), Takahashi
patent: 4652757 (1987-03-01), Carver
patent: 4750822 (1988-06-01), Rosencwaig et al.
patent: 4790664 (1988-12-01), Saito et al.

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