Single aperture confocal scanning epi-illumination microscope

Details Single aperture confocal scanning epi-illumination microscope Single aperture confocal scanning epi-illumination microscope

1988-09-14

1989-12-05

Arnold, Bruce Y.

350527, 350266, G02B 2100, G02B 2106, G02B 2602

Patent

active

048848816

ABSTRACT:
A single aperture confocal scanning epi-illumination microscope comprises an assembly including, in one embodiment, a pair of intermediate lenses to create a second field plane conjugate to the specimen plane in both the incident and reflected light paths, with a single aperture positioned at this second conjugate field plane and controllably scanned through the plane to create the incident light beam as well as to mask the returning light before viewing. In a second embodiment, only a single lens is included in the assembly and the objective lens may be positioned at its correct tube length, a distance substantially shorter, or a non-standard objective lens may be used.

REFERENCES:
patent: 3664751 (1972-05-01), Haas
patent: 3926500 (1975-12-01), Frosch et al.
patent: 4062623 (1977-12-01), Suzuki et al.
patent: 4215934 (1980-08-01), Karasawa et al.
patent: 4323299 (1982-04-01), Roberts
patent: 4359282 (1982-11-01), Garrison

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