Simultaneous pin short and continuity test on IC packages

Details Simultaneous pin short and continuity test on IC packages Simultaneous pin short and continuity test on IC packages

2006-05-23

2006-05-23

Karlsen, Ernest (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB, C324S537000

Reexamination Certificate

active

07049842

ABSTRACT:
An integrated circuit functionality test determining shorts between adjacent pins of all the IC pins while simultaneously determining pin continuity in only three steps. The process includes categorizing all pins of the IC into three sets of pins. One set of pins is connected to digital instruments, a second set of pins is connected to 0 volts, and a third set of pins is left open. The digital instruments sink current in parallel from the first set of pins to identify any shorts of the first set of pins. The process is repeated for each of the other two sets of pins. For IC packages having double and quad terminal positions, each terminal position is treated like a single terminal position, and the measurements of the respective sets of pins of each terminal position is measured in parallel.

REFERENCES:
patent: 3851161 (1974-11-01), Sloop
patent: 4241307 (1980-12-01), Hong
patent: 4395767 (1983-07-01), Van Brunt et al.
patent: 4779041 (1988-10-01), Williamson, Jr.
patent: 6590382 (2003-07-01), Angelotti et al.
patent: 6710607 (2004-03-01), Fujii et al.

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