Simultaneous physical and protocol layer analysis

Details Simultaneous physical and protocol layer analysis Simultaneous physical and protocol layer analysis

2011-06-21

2011-06-21

Vo, Don N (Department: 2611)

Pulse or digital communications

Testing

With indicator

Reexamination Certificate

active

07965764

ABSTRACT:
A method and apparatus for capturing an analog waveform on a serial bus. The method comprises the steps of designating a predetermined digital data sequence, decoding a serial data signal carried on a serial data bus, and comparing the decoded serial data signal to the predetermined digital data sequence. When it is determined that a portion of the decoded serial data matches the predetermined digital data sequence, the portion of the serial data signal corresponding to the matching portion of the decoded serial data signal is marked.

REFERENCES:
patent: 4094310 (1978-06-01), McEachem et al.
patent: 4109243 (1978-08-01), Day et al.
patent: 4139903 (1979-02-01), Morrill, Jr. et al.
patent: 4774498 (1988-09-01), Traa
patent: 4991581 (1991-02-01), Andries
patent: 5039937 (1991-08-01), Mandt et al.
patent: 5107377 (1992-04-01), Ballard
patent: 5214784 (1993-05-01), Ward et al.
patent: 5446650 (1995-08-01), Overhage et al.
patent: 5517105 (1996-05-01), Holzwarth
patent: 5854996 (1998-12-01), Overhage et al.
patent: 5877620 (1999-03-01), Tomi
patent: 5923161 (1999-07-01), Frankovitch et al.
patent: 6002104 (1999-12-01), Hsu
patent: 6038262 (2000-03-01), Ganter
patent: 6195617 (2001-02-01), Miller
patent: 6311138 (2001-10-01), Miller
patent: 6327544 (2001-12-01), Samuels
patent: 6442730 (2002-08-01), Schachner et al.
patent: 6518744 (2003-02-01), Tallman et al.
patent: 6525525 (2003-02-01), Azinger
patent: 6556202 (2003-04-01), Taraki et al.
patent: 6570592 (2003-05-01), Sajdak et al.
patent: 6639607 (2003-10-01), Ferguson et al.
patent: 6690398 (2004-02-01), Beck et al.
patent: 6707474 (2004-03-01), Beck et al.
patent: 6795515 (2004-09-01), Riedle et al.
patent: 6847349 (2005-01-01), Azinger
patent: 6850852 (2005-02-01), Ferguson et al.
patent: 7224363 (2007-05-01), Kamiyama
patent: 7756199 (2010-07-01), Gamper et al.
patent: 2001/0046222 (2001-11-01), Hoshiko
patent: 2003/0095099 (2003-05-01), Azinger
patent: 2003/0220753 (2003-11-01), Pickerd et al.
patent: 2005/0038615 (2005-02-01), Kobalka et al.
patent: 2000 088612 (2000-03-01), None
“New Oscilloscopes Target Cost-Sensitive Customers in Performance-driven Applications” Tektronix, www.tek.com, Jan. 6, 2005.
“Signal Integrity: Faster and Simpler Debugging with Integrated Digital Analog Measurement”, Tektronix, www.tek.com, Sep. 20, 2002.

Affiliated with

Also associated with

Rating

Simultaneous physical and protocol layer analysis does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Simultaneous physical and protocol layer analysis, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Simultaneous physical and protocol layer analysis will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2714133