Optics: measuring and testing – Velocity or velocity/height measuring
Reexamination Certificate
2011-01-25
2011-01-25
Nguyen, Sang (Department: 2886)
Optics: measuring and testing
Velocity or velocity/height measuring
C356S630000
Reexamination Certificate
active
07876423
ABSTRACT:
A process for simultaneously measuring the velocity of terahertz electromagnetic radiation in a dielectric material sample without prior knowledge of the thickness of the sample and for measuring the thickness of a material sample using terahertz electromagnetic radiation in a material sample without prior knowledge of the velocity of the terahertz electromagnetic radiation in the sample is disclosed and claimed. The process evaluates, in a plurality of locations, the sample for microstructural variations and for thickness variations and maps the microstructural and thickness variations by location. A thin sheet of dielectric material may be used on top of the sample to create a dielectric mismatch. The approximate focal point of the radiation source (transceiver) is initially determined for good measurements.
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Earp, III Ruth H.
Mitchell Kenneth
Nguyen Sang
The United States of America as represented by the National Aero
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