Simultaneous inversion for source wavelet and AVO parameters...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Earth science

Reexamination Certificate

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C703S005000

Reexamination Certificate

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07072767

ABSTRACT:
The present invention provides for a method and apparatus for seismic data processing. Prestack seismic data is obtained that contains a plurality of reflectors. Non-parallel moveout of the plurality of reflectors is utilized to determine a source wavelet using an L2-Norm and a reflectivity parameter using an L1-Norm. The source wavelet and reflectivity parameters can be determined simultaneously. Source and reflectivity determination may further comprise minimization of a model objective function. The model objective function may be a function of at least one of i) said source wavelet, ii) a gradient parameter and iii) an intercept parameter. An AVO intercept and gradient parameters can be determined using the determined source wavelet and reflectivity parameter. Constraints may be placed on parameters to ensure physically realistic solutions.

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