Simultaneous capacitive open-circuit testing

Details Simultaneous capacitive open-circuit testing Simultaneous capacitive open-circuit testing

1994-09-08

1996-01-23

Regan, Maura K.

Electricity: measuring and testing

Testing potential in specific environment

Voltage probe

324537, 324522, 324520, G01R 3102

Patent

active

054867533

ABSTRACT:
To test for proper connections of integrated-circuit connection pins (22) on a circuit board (12) to the conductive paths to which they should be connected, a tester (10) applies signals of different frequencies to paths to be connected to different IC pins provided by the same integrated-circuit package (24). The resultant composite electric-field signal in the vicinity of the integrated-circuit package (24) is coupled to a capacitive probe (42), and the probe signal is subjected to frequency analysis (58-1, 58-2 , . . . 58-J) to determine whether the applied frequency components are present in the signal with sufficient magnitudes. If the magnitude in the sensed signal of an applied frequency component is not great enough, the tester generates an indication that the corresponding IC pin has not been properly connected.

REFERENCES:
patent: 3155898 (1964-11-01), Chope
patent: 3252087 (1966-05-01), Parke
patent: 3323049 (1967-05-01), Hanken
patent: 4506210 (1985-03-01), Chase
patent: 4565966 (1986-01-01), Burr et al.
patent: 4857833 (1989-08-01), Gonzalez et al.
patent: 4862071 (1989-08-01), Sato et al.
patent: 5254953 (1993-10-01), Crook et al.
patent: 5266901 (1993-11-01), Woo
patent: 5268645 (1993-12-01), Prokoff et al.
Mahoney, DSP-Based Testing of Analog and Mixed Signal Circuits, Chapter 5, pp. 61-74 Apr. 1987.

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