Simulation of noise behavior of non-linear circuit

Details Simulation of noise behavior of non-linear circuit Simulation of noise behavior of non-linear circuit

1995-02-10

1997-10-28

Teska, Kevin J.

Boots, shoes, and leggings

364489, G01R 3128, G06F 1900

Patent

active

056823363

ABSTRACT:
The noise performance of a non-linear circuit design is measured prior to circuit fabrication by a circuit modelling and analysis mechanism, which simulates each noise source as a reduced complexity continuous Gaussian noise waveform. A respective noise source (e.g. thermal or shot) is modelled as a time domain sequence of continuously connected third order polynomial signal waveforms, forming a cubic spline that interconnects successively occurring Gaussian signal amplitude values. For each type of noise source, its associated Gaussian function is determined by the product of the constant multipliers associated with that type of source. The number of points processed for each noise source depends upon the time width of a noise analysis window. Any changes to the noise performance-analyzed circuit design are then effected and the noise performance of the modified circuit is reanalyzed, as necessary, prior to fabrication, thereby ensuring that the operational behavior of the manufactured circuit will meet its intended noise performance specification.

REFERENCES:
patent: H1458 (1995-07-01), Slack
patent: 4594677 (1986-06-01), Barlow
patent: 4876509 (1989-10-01), Perlmutter
Sarpeshkar et al., "White Noise in MOS Transistors and Resistors," Nov. 1993, IEEE Circuits and Devices, pp. 23-29.

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