Simulated module load

Details Simulated module load Simulated module load

2007-11-06

2007-11-06

Deb, Anjan (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C714S718000, C324S755090

Reexamination Certificate

active

10654342

ABSTRACT:
A circuit and method of operation for simulating a capacitive load for an integrated circuit or chip. The circuit adds a small capacitor to a test cell that tests the performance of a chip, such as a DRAM memory device, so that it may be tested realistically before being soldered into a final assembly, such as a DRAM module. Other passive devices, such as inductors or resistors may also be used in place of or in addition to a capacitor. By providing increased capacitance, or inductance or resistance for the test sequence, each circuit is tested under more realistic conditions. In one example, DRAM memory device modules may be realistically tested for performance by using sockets with small capacitors hard wired between pins of the DRAM device and a test interface used to perform the tests.

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