Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Patent
1997-01-31
1998-12-01
Brown, Glenn W.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Parameter related to the reproduction or fidelity of a...
174 35R, 174 35MS, G01R 2728
Patent
active
058444173
ABSTRACT:
The degree of variation in the normalized site attenuation of an RF test chamber may be reduced by adjusting the properties of the RF absorbers lining the walls of the RF test chamber such that for the frequencies of greatest variation the ground screen formed by the conductive floor of the chamber appears to be much greater than its actual finite size. This may be done by progressively reducing the degree of chamber wall absorption (for the frequencies of interest) for locations on the walls closer to the floor. The reduction begins at a height above the floor equal to the height of the device under test above the floor, and proceeds to some maximum reduction in absorption at the level of the floor. The reduction in absorption has the effect of making the ground screen appear to be much larger than it really is, and may be obtained either by spacing the absorbing tiles apart by increasing amounts nearer to the floor, or by using less absorptive tiles closer to the floor, or both.
REFERENCES:
patent: 4869970 (1989-09-01), Gulla et al.
patent: 5053712 (1991-10-01), Hansen
patent: 5603196 (1997-02-01), Sohlstrom
Babb Samuel M.
Kolb Lowell E.
Brown Glenn W.
Hewlett--Packard Company
Miller Edward L.
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