Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1984-09-20
1987-04-07
Eisenzopf, Reinhard J.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
324158R, G01R 3126
Patent
active
046564195
ABSTRACT:
The quality of photovoltaic semiconductor material for use in solar cells may be determined through the determination of the minority carrier diffusion length, in a simple manner. First, a thick slug or a thin plate or slice of the semiconductor material is polished on the front side, and mechanically finished in a predetermined manner on the back side. Then light at two different wavelengths, is applied to the plate, and the photovoltage and light intensity is measured first with light of one wavelength incident thereon, and then with light of the other wavelength. The ratio of the two intensities required to give the same output photovoltage determines the minority carrier diffusion length. The apparatus includes a light chopper, a photocell or thermocouple for determining relative intensity, and a simple mounting cell, for non-destructively coupling to the semiconductor sample with sensing electrodes, on the opposite sides of the sample. The circuitry may include a digital voltmeter and a microprocessor.
REFERENCES:
patent: 4333051 (1982-06-01), Goodman
"Measurement of Minority Carrier Lifetime and Diffusion Length in Silicon Epitaxial Layers-" Muller et al., 2/78.
"Preparation and Evaluation of the Properties of GaAs" Herzog, 11/62.
"Surface Treatment of Silicon for Low Recombination Velocity " by Moore et al., 3/56, RCA Rev., pp. 5-12.
"Interpretation of Steady State Surface Photovoltage Measurements in Epitaxial Semiconductor Layers", by Phillips, Solid. St. Elec., 1972, vol. 15, pp. 1097-1101.
"Diffusion Length Measurement by a Simple Photoresponse Technique", by Hovel, IEEE 12th Phot. Conf., pp. 913-916, 1976.
Burns W.
Eisenzopf Reinhard J.
Gudmestad Terje
Hughes Aircraft Company
Karambelas A. W.
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