Simplified pitch doubling process flow

Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching

Reexamination Certificate

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C438S706000, C257SE21038, C257SE21039

Reexamination Certificate

active

07732343

ABSTRACT:
A method for fabricating a semiconductor device comprises patterning a layer of photoresist material to form a plurality of mandrels. The method further comprises depositing an oxide material over the plurality of mandrels by an atomic layer deposition (ALD) process. The method further comprises anisotropically etching the oxide material from exposed horizontal surfaces. The method further comprises selectively etching photoresist material.

REFERENCES:
patent: 4234362 (1980-11-01), Riseman
patent: 4419809 (1983-12-01), Riseman et al.
patent: 4432132 (1984-02-01), Kinsbron et al.
patent: 4452442 (1984-06-01), Geschwindner
patent: 4502914 (1985-03-01), Trumpp et al.
patent: 4508579 (1985-04-01), Goth et al.
patent: 4570325 (1986-02-01), Higuchi
patent: 4648937 (1987-03-01), Ogura et al.
patent: 4713756 (1987-12-01), Mackiewicz
patent: 4716131 (1987-12-01), Okazawa et al.
patent: 4776922 (1988-10-01), Bhattascharyya et al.
patent: 4838991 (1989-06-01), Cote et al.
patent: 5013680 (1991-05-01), Lowrey et al.
patent: 5047117 (1991-09-01), Roberts
patent: 5053105 (1991-10-01), Fox, III
patent: 5117027 (1992-05-01), Bernhardt et al.
patent: 5328810 (1994-07-01), Lowrey et al.
patent: 5330879 (1994-07-01), Dennison
patent: 5470661 (1995-11-01), Bailey et al.
patent: 5502320 (1996-03-01), Yamada
patent: 5514885 (1996-05-01), Myrick
patent: 5670794 (1997-09-01), Manning
patent: 5753546 (1998-05-01), Koh et al.
patent: 5789320 (1998-08-01), Andricacos et al.
patent: 5795830 (1998-08-01), Cronin et al.
patent: 5830332 (1998-11-01), Babich et al.
patent: 5899746 (1999-05-01), Mukai
patent: 5905285 (1999-05-01), Gardner et al.
patent: 5998256 (1999-12-01), Juengling
patent: 6004862 (1999-12-01), Kim et al.
patent: 6010946 (2000-01-01), Hisamune et al.
patent: 6042998 (2000-03-01), Brueck et al.
patent: 6057573 (2000-05-01), Kirsch et al.
patent: 6063688 (2000-05-01), Doyle et al.
patent: 6071789 (2000-06-01), Yang et al.
patent: 6110837 (2000-08-01), Linliu et al.
patent: 6143476 (2000-11-01), Ye et al.
patent: 6211044 (2001-04-01), Xiang et al.
patent: 6282113 (2001-08-01), Debrosse
patent: 6288454 (2001-09-01), Allman et al.
patent: 6291334 (2001-09-01), Somekh
patent: 6297554 (2001-10-01), Lin
patent: 6330777 (2001-12-01), Padley
patent: 6335257 (2002-01-01), Tseng
patent: 6348380 (2002-02-01), Weimer et al.
patent: 6383907 (2002-05-01), Hasegawa et al.
patent: 6395613 (2002-05-01), Juengling
patent: 6404056 (2002-06-01), Kuge et al.
patent: 6423474 (2002-07-01), Holscher
patent: 6455372 (2002-09-01), Weimer
patent: 6475867 (2002-11-01), Hui et al.
patent: 6500756 (2002-12-01), Bell et al.
patent: 6514884 (2003-02-01), Maeda
patent: 6522584 (2003-02-01), Chen et al.
patent: 6534243 (2003-03-01), Templeton
patent: 6548396 (2003-04-01), Naik et al.
patent: 6559017 (2003-05-01), Brown et al.
patent: 6566280 (2003-05-01), Meagley et al.
patent: 6573030 (2003-06-01), Fairbairn et al.
patent: 6602779 (2003-08-01), Li et al.
patent: 6627933 (2003-09-01), Juengling
patent: 6632741 (2003-10-01), Clevenger
patent: 6638441 (2003-10-01), Chang et al.
patent: 6667237 (2003-12-01), Metzler
patent: 6673684 (2004-01-01), Huang et al.
patent: 6686245 (2004-02-01), Mathew et al.
patent: 6689695 (2004-02-01), Lui et al.
patent: 6707092 (2004-03-01), Sasaki
patent: 6709807 (2004-03-01), Hallock et al.
patent: 6734063 (2004-05-01), Willer et al.
patent: 6734107 (2004-05-01), Lai et al.
patent: 6744094 (2004-06-01), Forbes
patent: 6768663 (2004-07-01), Ogata
patent: 6773998 (2004-08-01), Fisher et al.
patent: 6777725 (2004-08-01), Willer et al.
patent: 6794699 (2004-09-01), Bissey et al.
patent: 6800930 (2004-10-01), Jackson et al.
patent: 6835662 (2004-12-01), Erhardt et al.
patent: 6867116 (2005-03-01), Chung
patent: 6875703 (2005-04-01), Furukawa et al.
patent: 6893972 (2005-05-01), Rottstegge et al.
patent: 6924191 (2005-08-01), Liu et al.
patent: 6936507 (2005-08-01), Tang et al.
patent: 6962867 (2005-11-01), Jackson et al.
patent: 7015124 (2006-03-01), Fisher et al.
patent: 7074668 (2006-07-01), Park et al.
patent: 7084076 (2006-08-01), Park et al.
patent: 7098105 (2006-08-01), Juengling
patent: 7115525 (2006-10-01), Abatchev
patent: 7183205 (2007-02-01), Hong
patent: 7183597 (2007-02-01), Doyle
patent: 7208379 (2007-04-01), Venugopal et al.
patent: 7288445 (2007-10-01), Bryant et al.
patent: 7291560 (2007-11-01), Parascandola et al.
patent: 2001/0005631 (2001-06-01), Kim et al.
patent: 2002/0042198 (2002-04-01), Bjarnason et al.
patent: 2002/0045308 (2002-04-01), Juengling
patent: 2002/0063110 (2002-05-01), Cantell et al.
patent: 2002/0068243 (2002-06-01), Hwang et al.
patent: 2002/0125536 (2002-09-01), Iwasa et al.
patent: 2002/0127810 (2002-09-01), Nakamura et al.
patent: 2002/0130348 (2002-09-01), Tran
patent: 2002/0130686 (2002-09-01), Forbes
patent: 2002/0135029 (2002-09-01), Ping et al.
patent: 2002/0158273 (2002-10-01), Satoh et al.
patent: 2003/0006410 (2003-01-01), Doyle
patent: 2003/0008461 (2003-01-01), Forbes et al.
patent: 2003/0040186 (2003-02-01), Juengling et al.
patent: 2003/0042542 (2003-03-01), Maegawa et al.
patent: 2003/0044722 (2003-03-01), Hsu et al.
patent: 2003/0073044 (2003-04-01), Reynolds
patent: 2003/0109102 (2003-06-01), Kujirai et al.
patent: 2003/0119307 (2003-06-01), Bekiaris et al.
patent: 2003/0127426 (2003-07-01), Chang et al.
patent: 2003/0157436 (2003-08-01), Manger et al.
patent: 2003/0207207 (2003-11-01), Li
patent: 2003/0207584 (2003-11-01), Sivakumar et al.
patent: 2003/0215978 (2003-11-01), Maimon et al.
patent: 2003/0216050 (2003-11-01), Golz et al.
patent: 2003/0218199 (2003-11-01), Forbes et al.
patent: 2003/0230234 (2003-12-01), Nam et al.
patent: 2004/0000534 (2004-01-01), Lipinski
patent: 2004/0017989 (2004-01-01), So
patent: 2004/0018738 (2004-01-01), Liu
patent: 2004/0023475 (2004-02-01), Bonser
patent: 2004/0023502 (2004-02-01), Tzou et al.
patent: 2004/0036095 (2004-02-01), Brown et al.
patent: 2004/0041189 (2004-03-01), Voshell et al.
patent: 2004/0043623 (2004-03-01), Liu
patent: 2004/0053475 (2004-03-01), Sharma
patent: 2004/0079988 (2004-04-01), Harari
patent: 2004/0106257 (2004-06-01), Okamura et al.
patent: 2004/0113171 (2004-06-01), Chiu et al.
patent: 2004/0157455 (2004-08-01), Johansson et al.
patent: 2004/0191997 (2004-09-01), Kawahara et al.
patent: 2004/0235255 (2004-11-01), Tanaka
patent: 2005/0042879 (2005-02-01), Yin
patent: 2005/0074949 (2005-04-01), Jung et al.
patent: 2005/0112886 (2005-05-01), Asakawa et al.
patent: 2005/0142497 (2005-06-01), Ryou
patent: 2005/0153562 (2005-07-01), Furukawa et al.
patent: 2005/0164454 (2005-07-01), Leslie
patent: 2005/0167394 (2005-08-01), Liu et al.
patent: 2005/0186705 (2005-08-01), Jackson et al.
patent: 2005/0202607 (2005-09-01), Furukawa et al.
patent: 2005/0272259 (2005-12-01), Hong
patent: 2005/0277249 (2005-12-01), Juengling
patent: 2006/0003182 (2006-01-01), Lane et al.
patent: 2006/0024940 (2006-02-01), Furukawa et al.
patent: 2006/0024945 (2006-02-01), Kim et al.
patent: 2006/0028859 (2006-02-01), Forbes
patent: 2006/0046161 (2006-03-01), Yin et al.
patent: 2006/0046200 (2006-03-01), Abatchev et al.
patent: 2006/0046201 (2006-03-01), Sandhu et al.
patent: 2006/0046407 (2006-03-01), Juengling
patent: 2006/0046422 (2006-03-01), Tran et al.
patent: 2006/0046484 (2006-03-01), Abatchev et al.
patent: 2006/0083996 (2006-04-01), Kim
patent: 2006/0134909 (2006-06-01), Nagase et al.
patent: 2006/0146092 (2006-07-01), Barnes et al.
patent: 2006/0172540 (2006-08-01), Marks et al.
patent: 2006/0189150 (2006-08-01), Jung
patent: 2006/0211260 (2006-09-01), Tran
patent: 2006/0216293 (2006-09-01), Couto
patent: 2006/0216923 (2006-09-01), Tran et al.
patent: 2006/0231900 (2006-10-01), Lee et al.
patent: 2006/0234138 (2006-10-01), Felhaber et al.
patent: 2006/0263699 (2006-11-01), Abatchev
patent: 2006/0267075 (2006-11-01), Sandhu et al.
patent: 2006/0273456 (2006-12-01), Sant
patent: 2006/0278911 (2006-12-01), Eppich
patent: 2006/0281266 (2006-12-01), Wells
patent: 2007/0018345 (2007-01-01), Chao et al.
patent: 2007/0026672 (2007-02-01), Tang et al.
patent: 2007/0045712 (2007-03-01), Haller et al.
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