Fishing – trapping – and vermin destroying
Patent
1986-04-28
1988-04-05
Chaudhuri, Olik
Fishing, trapping, and vermin destroying
437 61, 437228, 437233, 437239, H01L 21473
Patent
active
047359170
ABSTRACT:
A process for forming a silicon-on-sapphire integrated circuit comprises forming a layer of a conformal dielectric material, such as silicon dioxide, over a sapphire substrate having at least one island of silicon on a major surface thereof; forming a layer of a planarizing material over the dielectric layer, anisotropically etching the planarizing material for a time sufficient to expose the surface of the dielectric layer overlying the island; etching the dielectric layer for a time sufficient to expose at least the top surface of the island; removing the remaining planarizing material, growing a thin layer of gate oxide on the exposed surface of the island and providing a patterned layer of conductive polycrystalline silicon thereover. The etching of the dielectric layer can be continued to at least partially expose the sidewall surface of the islands. Preferably, etching is continued for a time sufficient to completely expose the sidewall surfaces of the isla
REFERENCES:
patent: 3511702 (1970-05-01), Jackson, Jr. et al.
patent: 3740280 (1973-06-01), Ronen
patent: 3890632 (1975-06-01), Ham et al.
patent: 3943542 (1976-03-01), Ho et al.
patent: 3974515 (1976-08-01), Ipri et al.
patent: 4002501 (1977-01-01), Tamura
patent: 4016016 (1977-04-01), Ipri
patent: 4076573 (1978-02-01), Shaw et al.
patent: 4160260 (1979-07-01), Weitzel et al.
patent: 4174217 (1979-11-01), Flatley
patent: 4178191 (1979-12-01), Flatley
patent: 4183134 (1980-01-01), Dehler et al.
patent: 4199384 (1980-04-01), Hsu
patent: 4199773 (1980-04-01), Goodman et al.
patent: 4242156 (1980-12-01), Peel
patent: 4252582 (1981-02-01), Anantha et al.
patent: 4263709 (1981-04-01), Weitzel et al.
patent: 4277884 (1981-07-01), Hsu
patent: 4313809 (1982-02-01), Benyon
patent: 4323910 (1982-04-01), Sokoloski et al.
patent: 4341569 (1982-03-01), Yaron et al.
patent: 4356623 (1982-11-01), Hunter
patent: 4368085 (1983-01-01), Peel
patent: 4385937 (1983-05-01), Ohmura
patent: 4393572 (1983-07-01), Policastro et al.
patent: 4393578 (1983-07-01), Cady et al.
patent: 4395726 (1983-07-01), Maeguchi
patent: 4447823 (1984-05-01), Maeguchi et al.
patent: 4455738 (1984-06-01), Houston et al.
patent: 4472459 (1984-09-01), Fisher
patent: 4491856 (1985-01-01), Egawa et al.
patent: 4523963 (1985-06-01), Ohta et al.
patent: 4533934 (1985-08-01), Smith
patent: 4547231 (1985-10-01), Hine
patent: 4557794 (1985-12-01), McGinn et al.
patent: 4604304 (1986-08-01), Faraone et al.
patent: 4658495 (1987-04-01), Flatley et al.
Ansell et al., "CMOS in Radiation Environments," VLSI Systems, Sep. 1986, pp. 28-36.
Hughes et al., "Oxide Thickness Dependence of High-Energy-Electron-, VUV-, and Corona-Induced Charge in MOS Capacitors," Applied Physics Letters, vol. 29, No. 6, Sep. 15, 1976, pp. 377-379.
Naruke et al., "Radiation-Induced Interface States of Poly-Si Gate MOS Capacitors Using Low Temperature Gate Oxidation," IEEE Transactions on Nuclear Science, vol. NS-30, No. 6, Dec. 1983, pp. 4054-4058.
Saks et al., "Radation Effects in MOS Capacitors with Very Thin Oxides at 80.degree. K.," IEEE Transactions on Nuclear Science, vol. NS-31, No. 6, Dec. 1984, pp. 1249-1255.
K. Tanno et al., "Selective Silicon Epitaxy Using Reduced Pressure Technique," Japanese Journal of Applied Physics, vol. 21, No. 9, Sep. 1982, pp. L564-566.
W. E. Ham, "The Study of Microcircuits by Transmission Electron Microscopy", RCA Review, vol. 38, Sep. 1977, pp. 351-389.
J. S. Chang, "Selective Reactive Ion Etching of Silicon Dioxide," Solid State Technology, Apr. 1984, pp. 214-219.
Flatley Doris W.
Schlesier Kenneth M.
Chaudhuri Olik
General Electric Company
Limberg Allen LeRoy
Swope R. Hain
Trygg James M.
LandOfFree
Silicon-on-sapphire integrated circuits does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Silicon-on-sapphire integrated circuits, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Silicon-on-sapphire integrated circuits will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2233650