Silicon on insulator device and layout method of the same

Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Having semi-insulating component

Reexamination Certificate

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Details

C438S014000, C438S237000, C438S527000, C257SE27112, C257SE21545, C257SE27062, C257SE21191

Reexamination Certificate

active

10956094

ABSTRACT:
A silicon on insulator (SOI) semiconductor device includes a wire connected to doped regions formed in an active layer of a SOI substrate. A ratio of the area of the wire to the doped region or a ratio of the area of contact holes formed on the wire to the doped region is limited to a predetermined value. When the ratio exceeds the predetermined value, a dummy doped region is added to prevent the device from being damaged during a plasma process.

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Statement of Relevance for JP A 7-106579, no date.

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