Silicon ion emitter electrodes

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428641, 313311, 313633, 250423R, 250424, H01J 2700

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active

054477638

ABSTRACT:
The present invention relates to ion emitter tip metals and alloys for ionizing the molecules of a gas which concurrently produces small diameter and very low numbers of unwanted particles. Specifically, the invention discloses ion emitter tip materials which, when subjected to normal operating electrical conditions of between about 0.1 and 100 microamperes per emitter tip, produces about 1 particle or less having a diameter of about 0.5 microns or less per cubic foot. Useful ion emitter tip materials include zirconium, titanium, molybdenum, tantalum, rhenium or alloys of these metals. In a specific embodiment, the metal alloys comprise zirconium and rhenium, titanium and rhenium, molybdenum and rhenium, or tantalum and rhenium. Silicon coated metal emitter tips, particularly titanium-silicon coated are disclosed. The emitter tip materials are useful to obtain Class 1 clean room standards in static air or flowing air environments used, for example, in semiconductor manufacture. A preferred ion emitter tip is of silicon of 99.99% plus purity, optionally containing a dopant of phosphorus, boron or antimony. The emitter tip is has a cone/cylinder shape.

REFERENCES:
patent: 3134906 (1964-05-01), Henker
patent: 3711743 (1973-01-01), Bolasny
patent: 3745000 (1973-07-01), Cheney et al.
patent: 3870933 (1975-03-01), Huber
patent: 3894852 (1975-07-01), von Berckheim
patent: 3942072 (1976-03-01), Best et al.
patent: 3970888 (1976-07-01), Tratiner
patent: 4092543 (1978-05-01), Levy
patent: 4107756 (1978-08-01), Best et al.
patent: 4110612 (1978-08-01), Ligon, Jr. et al.
patent: 4210949 (1980-07-01), Masuda et al.
patent: 4227894 (1980-10-01), Proynoff
patent: 4301369 (1981-11-01), Matsuo et al.
patent: 4467240 (1984-08-01), Futamoto et al.
patent: 4631448 (1986-12-01), Tamura et al.
patent: 4638398 (1987-01-01), Brennecke et al.
patent: 4642728 (1987-02-01), Unger
patent: 4647348 (1987-03-01), Yamakita
patent: 4649279 (1987-03-01), Delmore
patent: 4670685 (1987-06-01), Clark, Jr. et al.
patent: 4725874 (1988-02-01), Ooga et al.
patent: 4739214 (1988-04-01), Barr
patent: 4757421 (1988-07-01), Mykkanen
patent: 4762975 (1988-08-01), Mahoney et al.
patent: 4768126 (1988-08-01), Le Vantine
patent: 4774414 (1988-09-01), Unemura et al.
patent: 4827371 (1989-05-01), Yost
patent: 4841409 (1989-06-01), Kalwar
patent: 4873200 (1989-10-01), Kawakatsu
patent: 4894253 (1990-01-01), Heineman et al.
patent: 4901194 (1990-02-01), Steinman et al.
patent: 4902640 (1990-02-01), Sachitano et al.
patent: 4946706 (1990-08-01), Fukuda
patent: 4980796 (1990-12-01), Huggins
Blitshteyn Mark, et al., "Contamination And Erosion Of Cleanroom Air Ionizer Emitters", Microcontamination, vol. 3, Aug. 8, 1985, pp. 28, 30-32.
Blitshteyn, Mark, et al., "Assessing The Effectiveness Of Cleanroom Ionization Systems", Microcontamination, vol. 3, Mar. 3, 1985, pp. 47-52, 76.
Hofer, W., et al., "Adsorbate Dependent Neutralization Of Ions Near A Surface", Nuclear Instruments And Methods In Physics Research, B2 (1984), pp. 391-395.
Sakurai, T., et al., "Field Calibration Using The Energy Distribution Of A Free-Space Field Ionization", Journal of Applied Physics, vol. 48, No. 6, Jun. 1977, pp. 2618-2625.
Okuyama, F., et al., "Properties Of Multiple Field Ion Emitters Of Tungsten And A Simple Method For Improving Their Inoization Efficienty", International Journal Of Mass Spectrometry and Ion Physics, vol. 27, No. 4, Aug. 1978, pp. 391-402.
Schmidt, W. A., et al., "Field Ion Emission From This Tungsten Wires Covered With a Layer From An Etching Procedure", International Journal of Mass Spectrometry and Ion Physics, vol. 38, No. 2-3, May 1981, pp. 241-254.
Kubby, J. A., et al., "High Resolution Structuring Of Emitter Tips For The Gaseous Field Ionization Source", Journal Vac. Sci. Technol. B4(1), Jan./Feb. 1986, pp. 120-125.
Rollgen, F. W., et al., "Field Ion Emitters For Field Description Of Salts", International Journal Mass. Spectrometry and Ion Physics, vol. 24, No. 2, Jun. 1977, pp. 235-238.
Matsuo, T., et al., "Silicon Emitter For Field Description Mass. Spectrometry", Analytical Chemistry, vol. 51, No. 1, Jan. 1979, pp. 69-72.
Suzuki, Masanori, et al., "Effectiveness Of Air Ionization Systems In Clean Rooms", Institute of Environmental Sciences 1988 Proceedings, pp. 405-412.
Welker, Roger, "Equivalence Between Surface Contamination Rates And Class 100 Conditions", Institute of Environmental Sciences 1988 Proceedings, pp. 449-454.
Yost, Michael, et al., "Method For Measuring Particles From Air Ionization Equipment", Institute of Environmental Sciences, 35th Annual Technical Meeting, May 3, 1989.

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